Date of Award
5-1999
Document Type
Thesis
Degree Name
Honors College Theses
Department
Electrical Engineering
First Advisor
Dr. James Cross
Second Advisor
Dr. Joyce W. O'Rourke
Third Advisor
Dr. Beverly Wade
Abstract
This paper presents the testing and the automation of dark current, photoresponse, and responsivity measurements for W-MSM photodetectors. The testing phase of this particular photodetector is performed in order to compare manual measurement results with automated measurement results done in Lab VIEW. The automation phase is performed in order to take measurements quickly and efficiently using Lab VIEW programs which imitate the functions of actual instruments used to take dark current, photoresponse, and responsivity measurements. So far, only the dark current measurements can be automated. However, in the future, Lab VIEW programs will be written in order to automate the photoresponse and responsivity. Once this is accomplished, the dark current, photoresponse, and responsivity measurements will be automated for Inverted MSM (I-MSM) photodetectors used in the three-dimensional, high-throughput architecture described below.
Recommended Citation
Monroe, Tiffany Evette, "The Testing and the automation of dark current, photoresponse and responsivity measurements for on-wafer metal semiconductor metal (W-MSM) photodetectors" (1999). Electronic Dissertations and Theses. 122.
https://digitalcommons.subr.edu/dissertations_theses/122