Date of Award
Spring 5-2002
Document Type
Thesis
Degree Name
Honors College Theses
Department
Electrical Engineering
Second Advisor
Dr. Joyce W. O'Rourke
Third Advisor
Dr. Beverly Wade
Abstract
The purpose of this research project is to give a precise temperature reading of various semiconductor devices. An accurate junction temperature measurement could allow you to eliminate heat sinks and fans if they are not needed or it could prevent your system from going down on a hot day. Nearly all integrated circuits contain input protection diodes to protect against static electricity. These diodes can be used to make the measurement process simple. The only procedure that is required is to disconnect one wire leading to the device to be tested. The junction temperature monitor is then connected to the two ends of the disconnected wire and ground. The voltage change across the diode is measured and related to a mathematical temperature equation. The Junction temperature monitor does not affect the operation of the device.
Recommended Citation
Marshall, Adrian L., "The PCI compatible junction temperature monitor" (2002). Electronic Dissertations and Theses. 110.
https://digitalcommons.subr.edu/dissertations_theses/110