Date of Award

Spring 5-2002

Document Type


Degree Name

Honors College Theses


Electrical Engineering

Second Advisor

Dr. Joyce W. O'Rourke

Third Advisor

Dr. Beverly Wade


The purpose of this research project is to give a precise temperature reading of various semiconductor devices. An accurate junction temperature measurement could allow you to eliminate heat sinks and fans if they are not needed or it could prevent your system from going down on a hot day. Nearly all integrated circuits contain input protection diodes to protect against static electricity. These diodes can be used to make the measurement process simple. The only procedure that is required is to disconnect one wire leading to the device to be tested. The junction temperature monitor is then connected to the two ends of the disconnected wire and ground. The voltage change across the diode is measured and related to a mathematical temperature equation. The Junction temperature monitor does not affect the operation of the device.